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Defect Inspection Equipment Product List and Ranking from 15 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. オプティマ Kanagawa//Trading company/Wholesale https://www.optima-1.co.jp/
  4. 4 null/null
  5. 5 オプセル Saitama//Testing, Analysis and Measurement
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Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Jul 09, 2025～Aug 05, 2025
This ranking is based on the number of page views on our site.

  1. Wafer defect inspection equipment
  2. Laser-type wafer surface defect inspection device - Laser Explorer
  3. Edge Defect Inspection Device "RXW Series" オプティマ https://www.optima-1.co.jp/
  4. 4 AR film defect inspection device 'EX2001S'
  5. 4 Hard Disk Surface Defect Inspection Device - Laser Explorer

Defect Inspection Equipment Product List

1～15 item / All 23 items

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For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products, among others.

This is a two-dimensional inspection device using a high-resolution camera and a high-precision X-Y stage. It is suitable for inspecting surface scratches and foreign objects on optical films, sheets, and touch panels, as well as for defect inspection. With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products. 【Features】 - Automatically saves inspection data and images - Camera pixel count: 9 million pixels - High optical resolution (1.8μm) allows for clear viewing of fine inspection areas - Ideal for inspecting peripheral electrodes of touch panels and disconnections or short circuits in fine wiring of printed circuit boards *For more details, please download the materials or contact us.

  • Defect Inspection Equipment
  • Flaw detection testing
  • Circuit Board Inspection Equipment

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Internal defect inspection device

Internal defect inspection device

Glass, quartz, crystal, etc.! An internal defect inspection device that visualizes internal defects in transparent materials.

The "Internal Defect Inspection Device" observes internal defects in transparent materials and liquids using laser light and a special optical system, detecting defects with dedicated image processing software. The maximum size is 2000×2000×500 (height) mm, and the defect detection capability ranges from 1μm (with a dedicated lens) to several mm. Additionally, defect inspection of parts that have been precisely processed after cutting transparent materials is possible with a super wide-field laser scanning imager. 【Features】 ■ Detects defects using laser sheet light with a dedicated optical lens system ■ Maximum size is 2000×2000×500 (height) mm ■ Defect detection capability ranges from 1μm (with a dedicated lens) to several mm ■ Available shapes include cylindrical and rectangular, accommodating both large and small items *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment

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Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Detecting hard-to-find defects using processing to make low-contrast images easier to see.

The "IR-MEMS100" is a fully automated MEMS defect inspection device that automatically transports bonded wafers using robots, captures images of the internal state of the wafers with a specialized infrared optical system, and detects various defects using a defect detection algorithm. Images are captured with a high-sensitivity infrared camera set in an infrared microscope, and a proprietary defect detection software identifies hard-to-see defect areas. 【Features】 ■ Captures images with a high-sensitivity infrared camera set in an infrared microscope and detects hard-to-see defect areas using proprietary defect detection software. ■ Uses processing (effect processing) to enhance low-contrast images, making it easier to detect hard-to-find defect areas. ■ Compatible wafer sizes are 4 inches, 6 inches, and 8 inches. ■ Defect detection capability is approximately 10μm. ■ Inspection time is 30 minutes per wafer. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Crystal Defect Inspection Device "EnVision"

Crystal Defect Inspection Device "EnVision"

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

"En-Vison" is a crystal defect inspection device that can non-contact and non-destructively measure and evaluate crystal defects within wafers, such as dislocation defects, oxygen precipitates, and stacking faults. It provides a high dynamic range for both defect size (15nm to sub-micron) and density (E6 to E10/cm3). By significantly improving detection sensitivity in the depth direction of the wafer and covering a wide range of densities and applications, it greatly enhances the detection sensitivity of stress-induced dislocation defects in the depth direction, which cannot be confirmed near the surface, compared to conventional methods. 【Features】 ■ Non-destructive / Non-contact ■ Visualizes defects that cannot be confirmed by conventional inspection devices ■ Target area: Active device area (near the surface) ■ Detection in raw silicon and at the depth of active devices ■ No specialized knowledge required *For more details, please refer to the related link page or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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Defect Inspection Device "New Wire Inspector"

Defect Inspection Device "New Wire Inspector"

Space-saving, high-speed, high-precision, low-cost! Defect inspection device suitable for small-diameter pipes and more.

The "New Wire Inspector" is an appearance inspection and defect detection device that targets the surfaces of ultra-thin catheters and similar items at high speeds. It can detect surface defects on φ0.1 wire and V-groove depth defects of 10μm on φ2 wire, enabling the detection of defects that were previously impossible with existing technology. This inspection device is recommended for those considering moving away from visual inspections. 【Features】 ■ Capable of detecting surface defects on φ0.1 wire ■ Can detect V-groove depth defects of 10μm on φ2 wire ■ Can detect even when materials are vibrating ■ Capable of 360-degree inspection with a single unit ■ Not limited by material type ■ Fastest inspection speed of 20m/min (full circumference) *For more details, please refer to the PDF document or feel free to contact us.

  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Wafer Surface Defect Inspection Device "MO-601HS"

Wafer Surface Defect Inspection Device "MO-601HS"

Fully automatic measurement with an auto-loader! Wafer surface defect inspection equipment.

The "MO-601HS" is a wafer surface defect inspection device that enables measurement across the entire wafer, allowing for the identification of crystal defects near the active layer of Si wafers as foreign substances and surface roughness or scratches on the surface. It is possible to confirm defects with actual images through the viewer function, as well as analyze defects through TEM observation using the laser marking function. As a method for non-destructive evaluation of the breakdown voltage and reliability of oxide films, it is utilized for maintaining the quality of annealed wafers and others. 【Features】 ■ Fully automated measurement with an auto-loader ■ Compatible with 200mm and 300mm wafers ■ High sensitivity: capable of detecting defects as small as 200nm in diameter ■ Full mapping measurement function for defects, foreign substances, and haze ■ Raster scan method with constant measurement conditions *For more details, please refer to the catalog or feel free to contact us.

  • Other inspection equipment and devices

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Press part defect inspection device

Press part defect inspection device

It has flexible characteristics and can adapt to various types of pressed parts.

Our company utilizes a "Press Parts Defect Inspection Device" that combines advanced vision technology and artificial intelligence algorithms for processing and analysis, enabling efficient, accurate, and comprehensive inspections. Thanks to the positioning and posture of the camera used for image capture, as well as the autofocus control algorithm, it is possible to conduct appearance inspections of press parts with varying sizes, different surface conditions, and numerous types of defects. Additionally, our high-speed imaging technology processes 30 images per second, allowing for online inspection of the presence or absence of defects greater than 1mm at a conveyor speed of 600mm/s. 【Product Features】 ■ Strong compatibility and convenience, high stability ■ Self-diagnostic function of the system ■ Accuracy in triggering image capture ■ Remote data monitoring *For more details, please download the PDF or feel free to contact us.

  • Defect Inspection Equipment

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Press part defect inspection device

Press part defect inspection device

It has flexible characteristics and can adapt to various types of pressed parts!

We would like to introduce the "Press Parts Defect Inspection Device," which combines advanced vision technology and artificial intelligence algorithms for processing and analysis, enabling efficient, accurate, and comprehensive inspections. Thanks to the positioning and posture of the camera used for image capture, along with the autofocus control algorithm, it is possible to conduct appearance inspections of press parts with varying sizes, different surface conditions, and numerous types of defects. The high-speed imaging technology processes 30 images per second, allowing for online inspection of the presence or absence of cracks over 1mm at a conveyor speed of 600mm/s. 【Features】 ■ Strong compatibility and convenience, high stability ■ System self-diagnosis function ■ Accuracy that triggers image capture ■ Remote data monitoring *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Other inspection equipment and devices
  • Visual Inspection Equipment

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High-speed defect inspection device for non-woven fabric

High-speed defect inspection device for non-woven fabric

Hidden defects are clearly visible! Non-woven fabric defect inspection device capable of detecting even light colors such as yellow.

The Media Research Institute's "High-Speed Defect Inspection Device for Non-Woven Fabrics" is the ideal defect inspection device for those struggling with issues such as fluff, shots, and wind cotton. Thanks to the multi-channel optical system's technology for capturing multiple images of defects, the integration of multiple optical systems emphasizes the contrast between defects and the base material. With a high-speed camera, it can also accommodate high-speed lines, and its technology allows for the detection of light colors such as yellow while maintaining high-speed performance for color detection. 【Features】 ■ Emphasizes the contrast between defects and the base material through the integration of multiple optical systems ■ Accommodates high-speed lines with a high-speed camera ■ Detects light colors such as yellow ■ Effective for colored non-woven fabrics such as black ■ Clearly reveals defects hidden in the base material *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Other inspection equipment and devices

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Film defect inspection device

Film defect inspection device

Inspection of 300mm wafers can be performed in less than one second for the entire field of view in a single shot.

【Device Overview】 It is capable of inspecting 300mm wafers in less than one second for the entire field of view in a single shot. Due to the short inspection time, it is also adopted in fully automated inspection lines. It starts with a small field optical system and can be applied to internal void inspections by using infrared as an optional light source. In recent years, wafers have been getting thinner, but this is a high-precision wafer crack inspection device that quickly inspects the entire field of view for issues such as the unevenness of BG processing, polishing marks, and chip cracks caused by stress. 【Device Features】 In addition to automatic inspection, a standalone type is also available, allowing for manual inspection. It can set any slice level, enabling inspections tailored to specific needs. Depending on the application, it also has a function for removing so-marks, automatically extracting defect components excluding polishing marks. 【Device Applications】 ● Patterned wafer crack inspection ● Bare wafer crack inspection ● Wafer edge damage inspection ● Evaluation of BG polishing marks ● Evaluation of slurry ● Residual stress in glass substrates ● Evaluation of stress relief ● Tension inspection of BG tape ● Inspection of distortion and scratches on compound wafers

  • Visual Inspection Equipment

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