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Defect Inspection Equipment Product List and Ranking from 47 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. AYAHA ENGINEERING CO.,LTD. Head office Shiga//Testing, Analysis and Measurement
  2. TOMITA CO.,LTD. Tokyo//Service Industry
  3. バイスリープロジェクツ Miyagi//software
  4. テクネ商事 Kanagawa//Machine elements and parts
  5. オプティマ https://www.optima-1.co.jp/ Kanagawa//Trading company/Wholesale
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Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. Internal Defects in Materials Inspection Device 3D V-ROX TOMITA CO.,LTD.
  2. Surface Defect Inspection Unit "SSMM-1R" バイスリープロジェクツ
  3. US CW Company☆ Maintenance tools for piping and heat exchange tubes. テクネ商事
  4. Edge Defect Inspection Device "RXW Series" オプティマ https://www.optima-1.co.jp/
  5. 5 Particle scanner for component cleanliness inspection "Micro Quick" インテクノス・ジャパン

Defect Inspection Equipment Product List

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Inspection equipment for production lines aimed at mid-level engineers.

Inspection equipment for production lines aimed at mid-level engineers.

Specialized books on the automated testing system construction tools "LabVIEW" and "TestStand"

We deliver a practical programming book useful in the manufacturing field for mid-level engineers. This time, we will cover how to create inspection programs that operate on production lines. Are you familiar with a software called TestStand? In factory production lines, inspections are conducted by combining various types of tests. Whenever the test content changes, such as the jump destination after a failure or the number of repetitions, programmers rush in to fix it... This software solves such inconveniences. In this text, we will explain how to create a full-fledged inspection device by combining test programs made with LabVIEW and TestStand. If you are involved in production lines for automotive equipment, semiconductors, or electrical and electronic devices, this is a must-check!

  • Technical and Reference Books
  • Technical Seminar
  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products, among others.

This is a two-dimensional inspection device using a high-resolution camera and a high-precision X-Y stage. It is suitable for inspecting surface scratches and foreign objects on optical films, sheets, and touch panels, as well as for defect inspection. With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products. 【Features】 - Automatically saves inspection data and images - Camera pixel count: 9 million pixels - High optical resolution (1.8μm) allows for clear viewing of fine inspection areas - Ideal for inspecting peripheral electrodes of touch panels and disconnections or short circuits in fine wiring of printed circuit boards *For more details, please download the materials or contact us.

  • Defect Inspection Equipment
  • Flaw detection testing
  • Circuit Board Inspection Equipment
  • Defect Inspection Equipment

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Collaborative Project Product Series

Collaborative Project Product Series

Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Inline inspection device "CONTACT ACE series"

Inline inspection device "CONTACT ACE series"

Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Inline inspection device "AIRIS ACE series"

Inline inspection device "AIRIS ACE series"

Emphasizing ease of use and expandability! A surface defect inspection device that can adapt flexibly to meet your needs!

The "AIRIS ACE Series" is an inline surface defect inspection device designed to match the characteristics of each industry. Considering the needs that will arise in 5 to 10 years, we emphasize expandability in both hardware and software. We support our customers with ease of use. We offer the base model of the series, "AIRIS-UC," and the "AIRIS-SP," which includes additional criteria for defect classification to meet a wider range of needs. 【Features】 ■ High expandability / Additional cameras and series ■ Multilingual support on the same platform ■ CoaXPress interface adopted ■ Processing capability improved by four times ■ Power consumption reduced by 43% *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Internal defect inspection device

Internal defect inspection device

Glass, quartz, crystal, etc.! An internal defect inspection device that visualizes internal defects in transparent materials.

The "Internal Defect Inspection Device" observes internal defects in transparent materials and liquids using laser light and a special optical system, detecting defects with dedicated image processing software. The maximum size is 2000×2000×500 (height) mm, and the defect detection capability ranges from 1μm (with a dedicated lens) to several mm. Additionally, defect inspection of parts that have been precisely processed after cutting transparent materials is possible with a super wide-field laser scanning imager. 【Features】 ■ Detects defects using laser sheet light with a dedicated optical lens system ■ Maximum size is 2000×2000×500 (height) mm ■ Defect detection capability ranges from 1μm (with a dedicated lens) to several mm ■ Available shapes include cylindrical and rectangular, accommodating both large and small items *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Detecting hard-to-find defects using processing to make low-contrast images easier to see.

The "IR-MEMS100" is a fully automated MEMS defect inspection device that automatically transports bonded wafers using robots, captures images of the internal state of the wafers with a specialized infrared optical system, and detects various defects using a defect detection algorithm. Images are captured with a high-sensitivity infrared camera set in an infrared microscope, and a proprietary defect detection software identifies hard-to-see defect areas. 【Features】 ■ Captures images with a high-sensitivity infrared camera set in an infrared microscope and detects hard-to-see defect areas using proprietary defect detection software. ■ Uses processing (effect processing) to enhance low-contrast images, making it easier to detect hard-to-find defect areas. ■ Compatible wafer sizes are 4 inches, 6 inches, and 8 inches. ■ Defect detection capability is approximately 10μm. ■ Inspection time is 30 minutes per wafer. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Super Continuum Web Guide

Super Continuum Web Guide

It operates with a low pulse energy laser to generate supercontinuum light.

It was developed to output supercontinuum light with a wide variety of applications more easily. It is sold as a fiber coupling module for easy use. OCTAVE photonics is a company that develops nanophotonic chips and manufactures and sells fiber coupling devices using those chips. OCTAVE photonics provides devices for generating supercontinuum light using pulsed lasers with nonlinear nanophotonic waveguides.

  • Other optical parts
  • Other physicochemical equipment
  • Defect Inspection Equipment

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Crystal Defect Inspection Device "EnVision"

Crystal Defect Inspection Device "EnVision"

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

"En-Vison" is a crystal defect inspection device that can non-contact and non-destructively measure and evaluate crystal defects within wafers, such as dislocation defects, oxygen precipitates, and stacking faults. It provides a high dynamic range for both defect size (15nm to sub-micron) and density (E6 to E10/cm3). By significantly improving detection sensitivity in the depth direction of the wafer and covering a wide range of densities and applications, it greatly enhances the detection sensitivity of stress-induced dislocation defects in the depth direction, which cannot be confirmed near the surface, compared to conventional methods. 【Features】 ■ Non-destructive / Non-contact ■ Visualizes defects that cannot be confirmed by conventional inspection devices ■ Target area: Active device area (near the surface) ■ Detection in raw silicon and at the depth of active devices ■ No specialized knowledge required *For more details, please refer to the related link page or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

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AR film defect inspection device 'EX2001S'

AR film defect inspection device 'EX2001S'

Equipped with horizontal FFU! High-speed clean inspection possible! Compact design AR film defect inspection device.

At Arrows Engineering, we handle the AR film defect inspection equipment manufactured by IT Tech. The 'EX2001S' is a defect inspection machine for anti-reflective films on glass substrates. It performs high-speed scan inspections of the surfaces and backs of transparent substrates using an inverted microscope and line camera to detect defects. 【Features and Functions】 - The maximum substrate size is 400mm, with auto-focus inspection for transparent substrates. - Detected defects include white foreign matter (gaps) and black foreign matter on the AR film substrate. - Minimum detection resolution is 2.8μm (1.4μm). - Review inspections can be remotely controlled (camera/lighting/objective magnification/stage and focus). *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Roland Corporation's defect detection device (non-destructive testing device)

Roland Corporation's defect detection device (non-destructive testing device)

Speedy quality control! Accurately detect minor defects in metal wires, coils, and more. *Demonstrations will be held at the Comprehensive Inspection Equipment Exhibition!

The Roland Corporation's "ECT40" is a dedicated device for detecting defects in metal components (semi-finished products) such as wires, cables, tubes, and coils. It captures changes in current caused by defects like cracks and detects aspects such as "weld seam surface" and "weld volume," contributing to the efficiency of quality control. 【Features】 ■ Operable on customer PCs (compatible with Win7/Win8) ■ Wide testing frequency range (1-12,000 kHz) ■ Auto-filter that automatically follows line speed ■ Various evaluation modes ■ Inspection log software included <This product will be exhibited at a trade show! Live demonstrations will be conducted!> "7th Comprehensive Inspection Equipment Exhibition" 　Date: September 17 (Wed) - 19 (Fri), 2014 　Venue: Tokyo Big Sight (Booth: East 6 J-43) 　Website: http://www.jima-show.jp/index.html *For more details about the product, please refer to the catalog or feel free to contact us.

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  • Defect Inspection Equipment
  • Defect Inspection Equipment

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[LPC] Ultrasonic Edge Sensor "PSM-46W Series"

[LPC] Ultrasonic Edge Sensor "PSM-46W Series"

We will perform web serpentine correction in combination with a dedicated controller and drive mechanism.

The "PSM-46W Series" is an ultrasonic edge sensor for detecting the edges of webs. The "46WS" with a switch panel allows for mode switching and teaching operations directly on the sensor body, making it convenient. Additionally, models with a switch panel can be configured into a simple system (consisting only of the drive unit and sensor) without using the "PEM type" controller. 【Features】 ■ Detects the edges of webs ■ Performs web skew correction in combination with dedicated controllers and drive units ■ Available in two shape types: "W" and "WX" ■ Detects the edge position of the web by changes in ultrasonic transmission ■ Can accurately detect without being affected by color, pattern, or transparency *For more details, please refer to the PDF materials or feel free to contact us.

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  • Sensors
  • Defect Inspection Equipment

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[LPC] Ultrasonic Edge Sensor 'PS-45'

[LPC] Ultrasonic Edge Sensor 'PS-45'

Miniaturized to about half the volume! An ultrasonic edge sensor that can be used in narrow spaces.

The PS-45 is an ultrasonic transmission-type web edge detector. It is used in combination with the control panel and drive of the Q-series for web wander control. It is suitable for detecting transparent objects as it is not affected by the web's transparency, color, or pattern. Additionally, it is more compact compared to the PS-400, allowing it to be used in narrow spaces. 【Features】 ■ Compact body ■ Stable detection due to ultrasonic technology ■ Can be installed in places previously deemed impossible due to mounting space constraints ■ Can reliably detect various web colors, patterns, and transparencies without being affected *For more details, please refer to the PDF materials or feel free to contact us.

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  • Sensors
  • Defect Inspection Equipment

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Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. Not only does simultaneous irradiation with multiple lasers allow for high-sensitivity detection of scratches, but it also determines the uneven shapes of the defects. Features: - Detection of micro defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Full auto-focus - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

  • others
  • Defect Inspection Equipment

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Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customizable options ■ Supports automatic inspection of one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment
  • Defect Inspection Equipment

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D&X Corporation Company Profile

D&X Corporation Company Profile

Capable of grinding processing and wafer inspection! Developed to meet new tape and customer requirements.

D&X mainly deals with consumables for semiconductors. We are capable of handling processes such as film formation, size down processing, regeneration processing, polishing, and wafer inspection. Our product lineup includes semiconductor-related tapes, wafers, UV lamps, and industrial machinery. We aim to develop new tapes tailored to our customers' needs and continuously conduct tape testing and research. 【Business Overview】 ■ Planning and sales of semiconductor consumables *For more details, please refer to the PDF document or feel free to contact us.

  • Company：D&X
  • Price：Other
  • Non-ferrous metals
  • Wafer processing/polishing equipment
  • Other semiconductors
  • Defect Inspection Equipment

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Wafer Surface Particle Scanner YPI-MX

Wafer Surface Particle Scanner YPI-MX

Standard device for non-patterned transparent and semi-transparent wafer surface particles!

In addition to silicon wafers, double-polished transparent wafers and single-side polished translucent wafers (back matte wafers) can also be measured. You can choose between automatic transport specifications and manual transport specifications. There is an option for microscope observation that allows for review after measurement.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Wafer Surface Particle Scanner YPI-MX-DC

Wafer Surface Particle Scanner YPI-MX-DC

Next-generation power semiconductor wafer particle inspection equipment for SiC/GaN.

Non-patterned SiC bulk wafer 0.1μm detection. Detection of micro-scratches. Ideal for confirming the cleaning of SiC and GaN wafers. Automatic and manual transport options are available. Microscopic observation function allows for review after measurement.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Defect Inspection Device "New Wire Inspector"

Defect Inspection Device "New Wire Inspector"

Space-saving, high-speed, high-precision, low-cost! Defect inspection device suitable for small-diameter pipes and more.

The "New Wire Inspector" is an appearance inspection and defect detection device that targets the surfaces of ultra-thin catheters and similar items at high speeds. It can detect surface defects on φ0.1 wire and V-groove depth defects of 10μm on φ2 wire, enabling the detection of defects that were previously impossible with existing technology. This inspection device is recommended for those considering moving away from visual inspections. 【Features】 ■ Capable of detecting surface defects on φ0.1 wire ■ Can detect V-groove depth defects of 10μm on φ2 wire ■ Can detect even when materials are vibrating ■ Capable of 360-degree inspection with a single unit ■ Not limited by material type ■ Fastest inspection speed of 20m/min (full circumference) *For more details, please refer to the PDF document or feel free to contact us.

  • Visual Inspection Equipment
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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[Case Study] Washer-Embedded CAP Bolt 'WA Socket'

[Case Study] Washer-Embedded CAP Bolt 'WA Socket'

Improving work efficiency! Introducing CAP bolts with washer integration.

The "WA Socket" is a CAP bolt with an integrated washer. It prevents forgetting to attach the washer and improves work efficiency. It is adopted in various industries such as automotive, construction, equipment, semiconductors, and robotics. Please feel free to contact us. 【Problem-Solving Examples】 ■ In the manufacturing site, washers are being manually integrated. 　→ With the WA Socket, the integration process can be omitted (time saving). ■ The bolt was tightened without a washer. 　→ The integrated design eliminates the risk of missing the washer. *For more details, please refer to the PDF document or feel free to contact us.

  • bolt
  • Defect Inspection Equipment

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Are you having trouble with the inspection process? <Detection Accuracy>

Are you having trouble with the inspection process? <Detection Accuracy>

Leave it to Matsumoto Electronics! Capable of detecting defects of 15μm at a line speed of 1200m/min.

In the manufacturing of precision machinery, high-precision parts are required. For such parts, inspection by the human eye is not possible. However, with our detector, defects of 15μm can be detected at a line speed of 1200m/min. Defects can be detected with very high precision while maintaining the speed of the line. For concerns regarding "detection accuracy," please leave it to Matsumoto Electronic Industries. 【Do you have any of these concerns?】 ■ I want to improve the detection accuracy of defects. ■ I delivered defective products and received complaints. ■ I want to take on new work, but our current inspection system cannot meet the required quality. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Wafer Surface Defect Inspection Device "MO-601HS"

Wafer Surface Defect Inspection Device "MO-601HS"

Fully automatic measurement with an auto-loader! Wafer surface defect inspection equipment.

The "MO-601HS" is a wafer surface defect inspection device that enables measurement across the entire wafer, allowing for the identification of crystal defects near the active layer of Si wafers as foreign substances and surface roughness or scratches on the surface. It is possible to confirm defects with actual images through the viewer function, as well as analyze defects through TEM observation using the laser marking function. As a method for non-destructive evaluation of the breakdown voltage and reliability of oxide films, it is utilized for maintaining the quality of annealed wafers and others. 【Features】 ■ Fully automated measurement with an auto-loader ■ Compatible with 200mm and 300mm wafers ■ High sensitivity: capable of detecting defects as small as 200nm in diameter ■ Full mapping measurement function for defects, foreign substances, and haze ■ Raster scan method with constant measurement conditions *For more details, please refer to the catalog or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

[To those in the third industry] Quality inspection device for plain surfaces 'Mujiken-Ex'

Don't overlook any shortcomings even on high-speed lines! This product is a must-see for anyone involved in the production lines of the three-product industry!

"Mujiken-Ex" is a system that inspects surface defects (such as scratches, dirt, and foreign objects) on plain materials like film, paper, and metal, which are transported at high speeds in various production and processing environments. It is also suitable for inspecting materials used for containers, packaging, and labels in cosmetics and pharmaceuticals. If the material is in a web (sheet) form, it can inspect a wide variety of products without selecting the measured object or substrate. By hardware (board) implementing a self-developed high-speed processing circuit dedicated to inspection, it achieves approximately twice the image processing of standard machines while maintaining a high level of accuracy in appearance inspection. 【Features】 ■ Image Processing: High-speed image processing capabilities with a rich set of algorithms ■ Optical System: High-speed compatible cameras. Long-distance and high-speed communication support ■ Diverse system configurations *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Appearance defect inspection machine

Appearance defect inspection machine

L1800 color general-purpose machine - featuring models like the eight-sided machine and E3000 color-specific type! Introducing a rich lineup.

We would like to introduce the "Appearance Defect Inspection Machine" that we handle. It features dedicated software specifically designed for fixed-shape inspection objects, allowing for easy and quick material change settings, such as the "E3000 Color Dedicated Type," and the "E8000 Color Compact Dedicated Type," which can be converted in 3 minutes without flatness correction due to its quick-change glass design. Please feel free to contact us if you have any inquiries. 【Product Lineup】 ■E3000 Color Dedicated Type ■L1800 Color General-Purpose Machine - Octagonal Machine ■E8000 Color Compact Dedicated Type *For more details, please download the PDF or feel free to contact us.

  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Nord-Lock washer embedded bolt

Nord-Lock washer embedded bolt

Prevent loosening more easily, quickly, and reliably! Available in sizes M5 to M12 (metal).

The "Nord-Lock Washer Integrated Bolt" is a unified product that incorporates a Nord-Lock washer, which prevents bolt loosening, into a hex bolt equivalent to strength class 4.8. Since the bolt and washer are integrated, it eliminates human errors such as forgetting to install the washer, allowing for quick and reliable installation regardless of the operator's skill level. Additionally, the ease of disassembly and reinstallation during maintenance reduces the time required for production maintenance, contributing to cost savings through increased productivity. 【Features】 ■ No forgetting to install due to the integrated bolt and washer ■ Contributes to reduced work time and cost savings ■ Long-term use is possible due to excellent corrosion-resistant surface treatment *For more details, please download the PDF or feel free to contact us.

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  • Defect Inspection Equipment

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Press part defect inspection device

Press part defect inspection device

It has flexible characteristics and can adapt to various types of pressed parts.

Our company utilizes a "Press Parts Defect Inspection Device" that combines advanced vision technology and artificial intelligence algorithms for processing and analysis, enabling efficient, accurate, and comprehensive inspections. Thanks to the positioning and posture of the camera used for image capture, as well as the autofocus control algorithm, it is possible to conduct appearance inspections of press parts with varying sizes, different surface conditions, and numerous types of defects. Additionally, our high-speed imaging technology processes 30 images per second, allowing for online inspection of the presence or absence of defects greater than 1mm at a conveyor speed of 600mm/s. 【Product Features】 ■ Strong compatibility and convenience, high stability ■ Self-diagnostic function of the system ■ Accuracy in triggering image capture ■ Remote data monitoring *For more details, please download the PDF or feel free to contact us.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Sealer Application Detection System

Sealer Application Detection System

It can be used immediately after installation with AI automatic identification! The adjustment time takes about 5 to 10 minutes.

The "Sealer Coating Detection System" is an AI-based coating inspection system that combines CV vision algorithm technology with AI algorithms. When inspecting various types and colors of workpieces on a single production line, data settings for different processes can be completed with just three parameter adjustments (detection area, upper limit of adhesive width, lower limit of adhesive width). This significantly reduces labor and time costs. 【Features】 ■ Map settings ■ Parameter settings in 3 steps ■ Quick adjustment of parameters for multiple and single positions ■ Simulation test verification ■ Summary of result data ■ Visualization management of detection data *For more details, please refer to the PDF document or feel free to contact us.

  • Painting Machine
  • Other painting machines
  • Inspection robot
  • Defect Inspection Equipment

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