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Defect Inspection Equipment Product List and Ranking from 46 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. 山梨技術工房 Yamanashi//Industrial Machinery
  2. クボタ計装 Osaka//Testing, Analysis and Measurement
  3. 三橋製作所 Kyoto//Industrial Machinery
  4. 4 バイスリープロジェクツ Miyagi//software
  5. 5 東洋機械 Osaka//Industrial Machinery
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Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. Wafer Surface Particle Scanner YPI-MX 山梨技術工房
  2. Surface Defect Inspection Unit "SSMM-1R" バイスリープロジェクツ
  3. [LPC] Ultrasonic Edge Sensor "PSM-46W Series" 三橋製作所
  4. On-off edge sensor 東洋機械
  5. 4 Murabiyuwaa 三明

Defect Inspection Equipment Product List

1～15 item / All 72 items

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Inspection equipment for production lines aimed at mid-level engineers.

Inspection equipment for production lines aimed at mid-level engineers.

Specialized books on the automated testing system construction tools "LabVIEW" and "TestStand"

We deliver a practical programming book useful in the manufacturing field for mid-level engineers. This time, we will cover how to create inspection programs that operate on production lines. Are you familiar with a software called TestStand? In factory production lines, inspections are conducted by combining various types of tests. Whenever the test content changes, such as the jump destination after a failure or the number of repetitions, programmers rush in to fix it... This software solves such inconveniences. In this text, we will explain how to create a full-fledged inspection device by combining test programs made with LabVIEW and TestStand. If you are involved in production lines for automotive equipment, semiconductors, or electrical and electronic devices, this is a must-check!

  • Technical and Reference Books
  • Technical Seminar
  • Semiconductor inspection/test equipment

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For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

For inspecting surface scratches, foreign objects, and defects! Fine defect inspection equipment.

With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products, among others.

This is a two-dimensional inspection device using a high-resolution camera and a high-precision X-Y stage. It is suitable for inspecting surface scratches and foreign objects on optical films, sheets, and touch panels, as well as for defect inspection. With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products. 【Features】 - Automatically saves inspection data and images - Camera pixel count: 9 million pixels - High optical resolution (1.8μm) allows for clear viewing of fine inspection areas - Ideal for inspecting peripheral electrodes of touch panels and disconnections or short circuits in fine wiring of printed circuit boards *For more details, please download the materials or contact us.

  • Defect Inspection Equipment
  • Flaw detection testing
  • Circuit Board Inspection Equipment

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Collaborative Project Product Series

Collaborative Project Product Series

Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.

  • Other inspection equipment and devices

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Inline inspection device "CONTACT ACE series"

Inline inspection device "CONTACT ACE series"

Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Inline inspection device "AIRIS ACE series"

Inline inspection device "AIRIS ACE series"

Emphasizing ease of use and expandability! A surface defect inspection device that can adapt flexibly to meet your needs!

The "AIRIS ACE Series" is an inline surface defect inspection device designed to match the characteristics of each industry. Considering the needs that will arise in 5 to 10 years, we emphasize expandability in both hardware and software. We support our customers with ease of use. We offer the base model of the series, "AIRIS-UC," and the "AIRIS-SP," which includes additional criteria for defect classification to meet a wider range of needs. 【Features】 ■ High expandability / Additional cameras and series ■ Multilingual support on the same platform ■ CoaXPress interface adopted ■ Processing capability improved by four times ■ Power consumption reduced by 43% *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Inline inspection device "FITS-3 Series"

Inline inspection device "FITS-3 Series"

Up to 4 series and expandable to 16 cameras! High resolution makes it possible to detect difficult defects!

The "FITS series" is a surface defect detection device that allows for the addition of cameras and series. With high resolution, it enables defect detection that is difficult to differentiate from the background. Algorithms effective for detecting uneven defects in strong backgrounds and faint line defects have become available. Additionally, the discrimination function allows for the classification of defects by type. 【Features】 ■ Can add cameras and series (up to 4 series, 16 cameras maximum) ■ Capable of compression processing ■ Can automatically identify the types of defects ■ A lineup that can be selected according to needs *For more details, please contact us.

  • Other inspection equipment and devices

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Marking Device Series

Marking Device Series

A wide variety of options are available, including compact and lightweight types, as well as models compatible with clean environments!

Ayaha Engineering offers a variety of "marking devices" tailored to product sizes, processing lines, and detected defects, ranging from film inspection, sheet inspection, and web inspection to non-woven fabric inspection, electrode sheet inspection, copper plate inspection, steel plate inspection, and metal foil inspection. The "AMK-Mini" separates the control box from the main unit, achieving ultra-compact and ultra-lightweight design. This allows for installation in locations that were previously difficult to access. Additionally, we have options like the "AMK-Clean," which can be installed in clean environments, and the controller-integrated type "AMK-S1." 【Features (AMK-Mini)】 ■ Separation of the control box from the main unit for ultra-compact and ultra-lightweight design ■ Enables installation in locations that were previously difficult to access ■ Standard equipped with label remaining quantity monitoring function ■ Signal output when labels run out using a countdown method *For more details, please contact us.

  • Other inspection equipment and devices
  • Other markings

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Internal defect inspection device

Internal defect inspection device

Glass, quartz, crystal, etc.! An internal defect inspection device that visualizes internal defects in transparent materials.

The "Internal Defect Inspection Device" observes internal defects in transparent materials and liquids using laser light and a special optical system, detecting defects with dedicated image processing software. The maximum size is 2000×2000×500 (height) mm, and the defect detection capability ranges from 1μm (with a dedicated lens) to several mm. Additionally, defect inspection of parts that have been precisely processed after cutting transparent materials is possible with a super wide-field laser scanning imager. 【Features】 ■ Detects defects using laser sheet light with a dedicated optical lens system ■ Maximum size is 2000×2000×500 (height) mm ■ Defect detection capability ranges from 1μm (with a dedicated lens) to several mm ■ Available shapes include cylindrical and rectangular, accommodating both large and small items *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment

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Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Fully Automatic Defect Inspection Device for MEMS 'IR-MEMS100'

Detecting hard-to-find defects using processing to make low-contrast images easier to see.

The "IR-MEMS100" is a fully automated MEMS defect inspection device that automatically transports bonded wafers using robots, captures images of the internal state of the wafers with a specialized infrared optical system, and detects various defects using a defect detection algorithm. Images are captured with a high-sensitivity infrared camera set in an infrared microscope, and a proprietary defect detection software identifies hard-to-see defect areas. 【Features】 ■ Captures images with a high-sensitivity infrared camera set in an infrared microscope and detects hard-to-see defect areas using proprietary defect detection software. ■ Uses processing (effect processing) to enhance low-contrast images, making it easier to detect hard-to-find defect areas. ■ Compatible wafer sizes are 4 inches, 6 inches, and 8 inches. ■ Defect detection capability is approximately 10μm. ■ Inspection time is 30 minutes per wafer. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Super Continuum Web Guide

Super Continuum Web Guide

It operates with a low pulse energy laser to generate supercontinuum light.

It was developed to output supercontinuum light with a wide variety of applications more easily. It is sold as a fiber coupling module for easy use. OCTAVE photonics is a company that develops nanophotonic chips and manufactures and sells fiber coupling devices using those chips. OCTAVE photonics provides devices for generating supercontinuum light using pulsed lasers with nonlinear nanophotonic waveguides.

  • Other optical parts
  • Other physicochemical equipment

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Crystal Defect Inspection Device "EnVision"

Crystal Defect Inspection Device "EnVision"

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

"En-Vison" is a crystal defect inspection device that can non-contact and non-destructively measure and evaluate crystal defects within wafers, such as dislocation defects, oxygen precipitates, and stacking faults. It provides a high dynamic range for both defect size (15nm to sub-micron) and density (E6 to E10/cm3). By significantly improving detection sensitivity in the depth direction of the wafer and covering a wide range of densities and applications, it greatly enhances the detection sensitivity of stress-induced dislocation defects in the depth direction, which cannot be confirmed near the surface, compared to conventional methods. 【Features】 ■ Non-destructive / Non-contact ■ Visualizes defects that cannot be confirmed by conventional inspection devices ■ Target area: Active device area (near the surface) ■ Detection in raw silicon and at the depth of active devices ■ No specialized knowledge required *For more details, please refer to the related link page or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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AR film defect inspection device 'EX2001S'

AR film defect inspection device 'EX2001S'

Equipped with horizontal FFU! High-speed clean inspection possible! Compact design AR film defect inspection device.

At Arrows Engineering, we handle the AR film defect inspection equipment manufactured by IT Tech. The 'EX2001S' is a defect inspection machine for anti-reflective films on glass substrates. It performs high-speed scan inspections of the surfaces and backs of transparent substrates using an inverted microscope and line camera to detect defects. 【Features and Functions】 - The maximum substrate size is 400mm, with auto-focus inspection for transparent substrates. - Detected defects include white foreign matter (gaps) and black foreign matter on the AR film substrate. - Minimum detection resolution is 2.8μm (1.4μm). - Review inspections can be remotely controlled (camera/lighting/objective magnification/stage and focus). *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Roland Corporation's defect detection device (non-destructive testing device)

Roland Corporation's defect detection device (non-destructive testing device)

Speedy quality control! Accurately detect minor defects in metal wires, coils, and more. *Demonstrations will be held at the Comprehensive Inspection Equipment Exhibition!

The Roland Corporation's "ECT40" is a dedicated device for detecting defects in metal components (semi-finished products) such as wires, cables, tubes, and coils. It captures changes in current caused by defects like cracks and detects aspects such as "weld seam surface" and "weld volume," contributing to the efficiency of quality control. 【Features】 ■ Operable on customer PCs (compatible with Win7/Win8) ■ Wide testing frequency range (1-12,000 kHz) ■ Auto-filter that automatically follows line speed ■ Various evaluation modes ■ Inspection log software included <This product will be exhibited at a trade show! Live demonstrations will be conducted!> "7th Comprehensive Inspection Equipment Exhibition" 　Date: September 17 (Wed) - 19 (Fri), 2014 　Venue: Tokyo Big Sight (Booth: East 6 J-43) 　Website: http://www.jima-show.jp/index.html *For more details about the product, please refer to the catalog or feel free to contact us.

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  • Defect Inspection Equipment

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